Cilab at NFCW Expo

Cilab

Cilab’s ci230 high speed NFC tester makes it quicker and easier to conduct pre-certification testing, so you can test smart, certify easy and speed up time to market.

NFC testing

CILAB explains how its high speed test equipment offers faster, easier pre-certification testing, leading to quicker, cheaper development and certification and speeding time to market. Sponsored by Cilab.

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Covershot - "Introducing Cilab: Test smart. Certify easy."
Renke Bienert, senior principal engineer, NXP

“Before you can fix something, you need to know the cause of the problem. Cilab’s ci230 lets you quickly and easily find your bug and fix it.”

Renke Bienert, senior principal engineer, NXP

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“We can do a full debug run in an hour, get more detailed results than our old test bench could produce — and get to work on a solution straight away. I am absolutely amazed by the speed of this thing. It’s a huge time saver.”

Chris Henry, chief engineer, Invenco

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Chris Henry, chief engineer, Invenco
Hans-Juergen Pirch, engineering director, HID Global

“With Cilab’s ci230, we don’t need to tie up our RF experts to do testing… We are getting ROI payback in 10 to 11 months”

Hans-Juergen Pirch, engineering director, HID Global

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See it in action

This real-time video shows Cilab’s NFC test equipment in action, completing a full EMVCo PCD Level 1 approval test in just 42 minutes.

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Screenshot of Cilab ci230 high speed NFC tester in action
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