Cilab’s ci230 high speed NFC tester makes it quicker and easier to conduct pre-certification testing, so you can test smart, certify easy and speed up time to market.
CILAB explains how its high speed test equipment offers faster, easier pre-certification testing, leading to quicker, cheaper development and certification and speeding time to market. Sponsored by Cilab.
See your RF field
Watch how Cilab’s NFC test suite can now show device developers their RF field in high resolution graphs based on more than 25,000 measurements taken in just 10 minutes. Sponsored by Cilab.
“I was amazed by the ci230’s capabilities. Cilab’s solution allows us to save time and money, accelerate our development cycle and provide the best possible service to our customers. It’s a real game changer.”
Ran Granot, lab manager, Nayax
“Cilab’s ci230 solution allows us to demonstrate the existing robustness of our products and to support our work with POS manufacturers during the integration phase.”
Manuel Sahm, technical leader, FEIG
“Before you can fix something, you need to know the cause of the problem. Cilab’s ci230 lets you quickly and easily find your bug and fix it.”
Renke Bienert, senior principal engineer, NXP
“We can do a full debug run in an hour, get more detailed results than our old test bench could produce — and get to work on a solution straight away. I am absolutely amazed by the speed of this thing. It’s a huge time saver.”
Chris Henry, chief engineer, Invenco
“With Cilab’s ci230, we don’t need to tie up our RF experts to do testing… We are getting ROI payback in 10 to 11 months”
Hans-Juergen Pirch, engineering director, HID Global
See it in action
This real-time video shows Cilab’s NFC test equipment in action, completing a full EMVCo PCD Level 1 test in just 42 minutes.